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#26  2024-01-12 11:40:42

  morfik - Cenzor wirtualnego świata

morfik
Cenzor wirtualnego świata
Skąd: ze WSI
Zarejestrowany: 2011-09-15
Serwis

Re: Konfiguracja Debiana do pracy na dysku SSD (trim/discard)

Dorobiłem jeszcze jednego arta o konfiguracji SWAP'a na dysku SSD, na wypadek gdyby ktoś tęsknił za hibernacją i nie chciał zbytnio zajechać komórek flash. xD

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#27  2024-01-30 18:06:56

  lama - Użytkownik

lama
Użytkownik
Zarejestrowany: 2012-08-28

Re: Konfiguracja Debiana do pracy na dysku SSD (trim/discard)

wrzucam wyniki po jakimś miesiącu od poprzedniego sprawdzenia, może się przydadzą.

Kod:

# smartctl -x /dev/sda
smartctl 7.3 2022-02-28 r5338 [x86_64-linux-6.1.0-17-amd64] (local build)
Copyright (C) 2002-22, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Silicon Motion based SSDs
Device Model:     Patriot P210 512GB
Serial Number:    P210ABCB2205260031
Firmware Version: V0414A0
User Capacity:    512 110 190 592 bytes [512 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Form Factor:      2.5 inches
TRIM Command:     Available
Device is:        In smartctl database 7.3/5577
ATA Version is:   ACS-3 T13/2161-D revision 4
SATA Version is:  SATA 3.2, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Tue Jan 30 17:58:39 2024 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
AAM feature is:   Unavailable
APM level is:     254 (maximum performance)
Rd look-ahead is: Enabled
Write cache is:   Enabled
DSN feature is:   Unavailable
ATA Security is:  Disabled, frozen [SEC2]
Wt Cache Reorder: Unavailable

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x02)    Offline data collection activity
                    was completed without error.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:         (  120) seconds.
Offline data collection
capabilities:              (0x11) SMART execute Offline immediate.
                    No Auto Offline data collection support.
                    Suspend Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    No Selective Self-test supported.
SMART capabilities:            (0x0002)    Does not save SMART data before
                    entering power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      (  10) minutes.
SCT capabilities:            (0x0001)    SCT Status supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAGS    VALUE WORST THRESH FAIL RAW_VALUE
  1 Raw_Read_Error_Rate     -O--CK   100   100   050    -    0
  5 Reallocated_Sector_Ct   -O--CK   100   100   050    -    0
  9 Power_On_Hours          -O--CK   100   100   050    -    631
 12 Power_Cycle_Count       -O--CK   100   100   050    -    272
160 Uncorrectable_Error_Cnt -O--CK   100   100   050    -    0
161 Valid_Spare_Block_Cnt   PO--CK   100   100   050    -    100
163 Initial_Bad_Block_Count -O--CK   100   100   050    -    11
164 Total_Erase_Count       -O--CK   100   100   050    -    3933
165 Max_Erase_Count         -O--CK   100   100   050    -    25
166 Min_Erase_Count         -O--CK   100   100   050    -    2
167 Average_Erase_Count     -O--CK   100   100   050    -    9
168 Max_Erase_Count_of_Spec -O--CK   100   100   050    -    5050
169 Remaining_Lifetime_Perc -O--CK   100   100   050    -    100
175 Program_Fail_Count_Chip -O--CK   100   100   050    -    0
176 Erase_Fail_Count_Chip   -O--CK   100   100   050    -    0
177 Wear_Leveling_Count     -O--CK   100   100   050    -    0
178 Runtime_Invalid_Blk_Cnt -O--CK   100   100   050    -    0
181 Program_Fail_Cnt_Total  -O--CK   100   100   050    -    0
182 Erase_Fail_Count_Total  -O--CK   100   100   050    -    0
192 Power-Off_Retract_Count -O--CK   100   100   050    -    27
194 Temperature_Celsius     -O---K   100   100   050    -    42
195 Hardware_ECC_Recovered  -O--CK   100   100   050    -    0
196 Reallocated_Event_Count -O--CK   100   100   050    -    0
197 Current_Pending_Sector  -O--CK   100   100   050    -    0
198 Offline_Uncorrectable   -O--CK   100   100   050    -    0
199 UDMA_CRC_Error_Count    -O--CK   100   100   050    -    0
232 Available_Reservd_Space -O--CK   100   100   050    -    100
241 Host_Writes_32MiB       ----CK   100   100   050    -    41954
242 Host_Reads_32MiB        ----CK   100   100   050    -    39441
245 TLC_Writes_32MiB        -O--CK   100   100   050    -    44604
                            ||||||_ K auto-keep
                            |||||__ C event count
                            ||||___ R error rate
                            |||____ S speed/performance
                            ||_____ O updated online
                            |______ P prefailure warning

General Purpose Log Directory Version 1
SMART           Log Directory Version 1 [multi-sector log support]
Address    Access  R/W   Size  Description
0x00       GPL,SL  R/O      1  Log Directory
0x01           SL  R/O      1  Summary SMART error log
0x02           SL  R/O      1  Comprehensive SMART error log
0x03       GPL     R/O      1  Ext. Comprehensive SMART error log
0x04       GPL,SL  R/O      8  Device Statistics log
0x06           SL  R/O      1  SMART self-test log
0x07       GPL     R/O      1  Extended self-test log
0x10       GPL     R/O      1  NCQ Command Error log
0x11       GPL     R/O      1  SATA Phy Event Counters log
0x24       GPL     R/O     88  Current Device Internal Status Data log
0x25       GPL     R/O     32  Saved Device Internal Status Data log
0x30       GPL,SL  R/O      9  IDENTIFY DEVICE data log
0x80-0x9f  GPL,SL  R/W     16  Host vendor specific log

SMART Extended Comprehensive Error Log Version: 1 (1 sectors)
No Errors Logged

SMART Extended Self-test Log Version: 1 (1 sectors)
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed without error       00%       630         -
# 2  Extended offline    Completed without error       00%       305         -
# 3  Extended offline    Completed without error       00%       232         -

Selective Self-tests/Logging not supported

SCT Status Version:                  3
SCT Version (vendor specific):       0 (0x0000)
Device State:                        Active (0)
Current Temperature:                    42 Celsius
Power Cycle Min/Max Temperature:     42/42 Celsius
Lifetime    Min/Max Temperature:     24/57 Celsius
Specified Max Operating Temperature:   100 Celsius
Under/Over Temperature Limit Count:   0/0

SCT Data Table command not supported

SCT Error Recovery Control command not supported

Device Statistics (GP Log 0x04)
Page  Offset Size        Value Flags Description
0x01  =====  =               =  ===  == General Statistics (rev 1) ==
0x01  0x008  4             272  ---  Lifetime Power-On Resets
0x01  0x010  4             631  ---  Power-on Hours
0x01  0x018  6      2749520995  ---  Logical Sectors Written
0x01  0x020  6        25664172  ---  Number of Write Commands
0x01  0x028  6      2584852182  ---  Logical Sectors Read
0x01  0x030  6        19725254  ---  Number of Read Commands
0x07  =====  =               =  ===  == Solid State Device Statistics (rev 1) ==
0x07  0x008  1               0  ---  Percentage Used Endurance Indicator
                                |||_ C monitored condition met
                                ||__ D supports DSN
                                |___ N normalized value

Pending Defects log (GP Log 0x0c) not supported

SATA Phy Event Counters (GP Log 0x11)
ID      Size     Value  Description
0x0001  4            0  Command failed due to ICRC error
0x0002  4            0  R_ERR response for data FIS
0x0005  4            1  R_ERR response for non-data FIS
0x000a  4            1  Device-to-host register FISes sent due to a COMRESET

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#28  2024-06-16 16:53:25

  morfik - Cenzor wirtualnego świata

morfik
Cenzor wirtualnego świata
Skąd: ze WSI
Zarejestrowany: 2011-09-15
Serwis

Re: Konfiguracja Debiana do pracy na dysku SSD (trim/discard)

Wygląda na to, że dyski SSD w obudowach USB lub podłączane przez adaptery USB-SATA rządzą się własnymi prawami i TRIM w takich przypadkach jest domyślnie wyłączony, by nie uszkodzić nośnika SSD. Napisałem kawałek artykułu na temat konfiguracji TRIM/UNMAP w przypadku stosowania adaptera USB-SATA i ciekaw jestem czy jeśli macie tego typu dyski to czy TRIM jest u was włączony lub wyłączony?

Poniżej kilka poleceń:

Kod:

# lsusb
# lsscsi -liv

# find /sys/ -name provisioning_mode -exec grep -H . {} + | sort

# cat /sys/block/sdc/queue/discard_max_bytes
# cat /sys/block/sdc/queue/discard_max_hw_bytes

Z tymi poniższymi poleceniami to lepiej ostrożnie, bo krążą słuchy, że mogą popsuć dyski z racji stosowania złego adaptera USB-SATA, albo i złego dysku (one tylko odpytują dysk o strony VPD, szczegóły w artykule). xD

Kod:

# sg_vpd -p bl /dev/sdc
# sg_vpd -p lbpv /dev/sdc

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